Industrial Products – Gilbert Pinter, Edward Brandel, Jeremy Brodersen, Individual
Abstract for “Machine vision systems and illumination sources for machine vision systems. Components for use with the illumination sources.”
The present disclosure generally refers to machine vision systems and illumination sources for machine vision system use, as well as components for use with the illumination sources. The present disclosure is more specific and relates to machine vision system incorporating multifunction illumination sources, multifunction illumination sources, or components for multi-function lighting sources.
Background for “Machine vision systems and illumination sources for machine vision systems. Components for use with the illumination sources.”
Machine vision systems depend on high quality images to produce quality output. Images of high quality enable the system interpret the information from the object being inspected accurately, which results in repeatable, reliable system performance. The lighting configuration can make a big difference in the quality of an image. A good image will yield good results, while a poor one will result in poor performance.
“Machine vision lighting should maximise feature contrast while minimising contrast of the rest to allow the camera to clearly see? The part or mark. Images with high contrast features make integration easier and are more reliable. Images with low contrast or uneven illumination will require more work from the system, and can increase processing time. The size of the part, its surface features, and geometry as well as the system requirements will determine the optimal lighting configuration. Machine vision lighting is customizable to meet specific requirements by offering a wide range of wavelengths (color), fields of view (size), as well as geometry (shape).
A machine vision system can include at least one patterned light source and at most one digital camera, orientated at a first angle relative the surface of an object to inspect. At least one patterned source light source can be oriented at a second position relative to the surface to be inspected so that the field of view of at least one of the digital cameras includes reflections of at most a portion the light emitted from the surface. A digital image data reception module may be included in the machine vision system. This module is stored on a memory device of a computing device and can cause the processor to receive digital images from at least one of the digital cameras. The digital image data could be representative of the reflection from at least a portion the light emitted from the surface to be inspected by the at most one patterned area lighting source. A phase measuring deflectometry program may be included in the machine vision system. This module is stored on the computer’s memory and may allow the processor to determine if the object being inspected has a defect.
“A machine vision system may also include at least one pattern area light source that is oriented to shine light towards the object to be inspected. A machine vision system could also include at most one digital camera with a view that is oriented towards the object to inspect. At least one digital camera’s field of view may include at least some of the light emitted from the at most one patterned-area light source. A digital image data reception module may be included in the machine vision system. This module is stored on a memory device and can cause a processor to receive digital images from at least one of the digital cameras. The digital image data can represent at least a portion the light emitted from at least one pattern area light source. A phase measuring deflectometry program may be included in the machine vision system. This module is stored on the computer’s memory and may allow the processor to determine if the object being inspected has a defect.
“A machine vision system may also include at least one pattern area light source that is oriented to shine light towards the object to be inspected. A machine vision system could also include at most one digital camera with a view that is oriented towards the object to inspect. At least one digital camera’s field of view may include at least some of the light emitted from the at most one patterned-area light source. A digital image data module may be included in the machine vision system. This module is stored on a memory device and can cause a processor to receive digital images from at least one of the digital cameras. The digital image data can represent at least a portion light emitted from the at most one patterned light source, or light emitted from the at minimum one patterned light source that is reflecting off the surface of the object being inspected. A phase measuring deflectometry program may be included in the machine vision system. This module is stored on the computer’s memory and may allow the processor to determine if the object being inspected has a defect.
“A machine vision system line scanner illuminator could include multiple independent lines of light emitters. Individual lines of a machine vision system line scanner illuminator could have different light sources. Individual lines can be controlled independently from one another by a machine vision system line scanner illuminator. Individual lines of a machine vision system line scanner illuminator can be pulsed separately with respect to each other.
“A multi-function machine vision system (illuminator) may also include a dome, a dark field light, a direct, bright-field, or off-axis light. A multi-function machine-vision system illuminator might include a coaxial light and at least two of the following: a dome, a dark field light, direct light, bright-field light, or an off-axis. Multi-function machine vision system illumination may have independently controlled light sources or groups of light sources.
“A machine vision system illuminator could also include a pattern emitter with gradient illumination between individual parts of the pattern.” A machine vision system illuminator could include a pattern emitter with gradient illumination that illuminates the individual parts of the pattern created by a liquid crystal display.
“A machine vision system can be configured with a multiline illuminator or multi-function and/or gradient illuminators in yet another embodiment. A machine vision system can be configured with a multiline illuminator and/or multi-function and/or gradient illuminator to analyze images from a camera that has been synchronized with one or more illuminators.
“In another embodiment, the machine vision system may also include a light emitting driver circuit. A light emitting diode circuit could have an on-time of less 10 nanoseconds.
Summary for “Machine vision systems and illumination sources for machine vision systems. Components for use with the illumination sources.”
Machine vision systems depend on high quality images to produce quality output. Images of high quality enable the system interpret the information from the object being inspected accurately, which results in repeatable, reliable system performance. The lighting configuration can make a big difference in the quality of an image. A good image will yield good results, while a poor one will result in poor performance.
“Machine vision lighting should maximise feature contrast while minimising contrast of the rest to allow the camera to clearly see? The part or mark. Images with high contrast features make integration easier and are more reliable. Images with low contrast or uneven illumination will require more work from the system, and can increase processing time. The size of the part, its surface features, and geometry as well as the system requirements will determine the optimal lighting configuration. Machine vision lighting is customizable to meet specific requirements by offering a wide range of wavelengths (color), fields of view (size), as well as geometry (shape).
A machine vision system can include at least one patterned light source and at most one digital camera, orientated at a first angle relative the surface of an object to inspect. At least one patterned source light source can be oriented at a second position relative to the surface to be inspected so that the field of view of at least one of the digital cameras includes reflections of at most a portion the light emitted from the surface. A digital image data reception module may be included in the machine vision system. This module is stored on a memory device of a computing device and can cause the processor to receive digital images from at least one of the digital cameras. The digital image data could be representative of the reflection from at least a portion the light emitted from the surface to be inspected by the at most one patterned area lighting source. A phase measuring deflectometry program may be included in the machine vision system. This module is stored on the computer’s memory and may allow the processor to determine if the object being inspected has a defect.
“A machine vision system may also include at least one pattern area light source that is oriented to shine light towards the object to be inspected. A machine vision system could also include at most one digital camera with a view that is oriented towards the object to inspect. At least one digital camera’s field of view may include at least some of the light emitted from the at most one patterned-area light source. A digital image data reception module may be included in the machine vision system. This module is stored on a memory device and can cause a processor to receive digital images from at least one of the digital cameras. The digital image data can represent at least a portion the light emitted from at least one pattern area light source. A phase measuring deflectometry program may be included in the machine vision system. This module is stored on the computer’s memory and may allow the processor to determine if the object being inspected has a defect.
“A machine vision system may also include at least one pattern area light source that is oriented to shine light towards the object to be inspected. A machine vision system could also include at most one digital camera with a view that is oriented towards the object to inspect. At least one digital camera’s field of view may include at least some of the light emitted from the at most one patterned-area light source. A digital image data module may be included in the machine vision system. This module is stored on a memory device and can cause a processor to receive digital images from at least one of the digital cameras. The digital image data can represent at least a portion light emitted from the at most one patterned light source, or light emitted from the at minimum one patterned light source that is reflecting off the surface of the object being inspected. A phase measuring deflectometry program may be included in the machine vision system. This module is stored on the computer’s memory and may allow the processor to determine if the object being inspected has a defect.
“A machine vision system line scanner illuminator could include multiple independent lines of light emitters. Individual lines of a machine vision system line scanner illuminator could have different light sources. Individual lines can be controlled independently from one another by a machine vision system line scanner illuminator. Individual lines of a machine vision system line scanner illuminator can be pulsed separately with respect to each other.
“A multi-function machine vision system (illuminator) may also include a dome, a dark field light, a direct, bright-field, or off-axis light. A multi-function machine-vision system illuminator might include a coaxial light and at least two of the following: a dome, a dark field light, direct light, bright-field light, or an off-axis. Multi-function machine vision system illumination may have independently controlled light sources or groups of light sources.
“A machine vision system illuminator could also include a pattern emitter with gradient illumination between individual parts of the pattern.” A machine vision system illuminator could include a pattern emitter with gradient illumination that illuminates the individual parts of the pattern created by a liquid crystal display.
“A machine vision system can be configured with a multiline illuminator or multi-function and/or gradient illuminators in yet another embodiment. A machine vision system can be configured with a multiline illuminator and/or multi-function and/or gradient illuminator to analyze images from a camera that has been synchronized with one or more illuminators.
“In another embodiment, the machine vision system may also include a light emitting driver circuit. A light emitting diode circuit could have an on-time of less 10 nanoseconds.
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